Part Number | Category | Family | Status | Description |
---|---|---|---|---|
SN74BCT8374ADW | Integrated Circuits (ICs) | Logic - Specialty Logic | Active | IC SCAN TEST DEVICE W/FF 24-SOIC |
SN74BCT8374ADWE4 Texas Instruments(TI) 30,000 2102+ IC SCAN TEST DEVICE W/FF 24-SOIC TPC Global Service Co.Ltd.
SN74BCT8374ADWR TI 10000 2013+ SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS World Link Parts components Dev.ltd-ORIGINAL ONLY
SN74BCT8374ADWRE4 Texas Instruments(TI) 30,000 2014+ IC SCAN TEST DEVICE W/FF 24-SOIC enkaite Electronics Co., Ltd
| ||||
SN74BCT8374ADWE4 | Integrated Circuits (ICs) | Logic - Specialty Logic | Active | IC SCAN TEST DEVICE W/FF 24-SOIC |
SN74BCT8374ADWE4 Texas Instruments(TI) 30,000 2102+ IC SCAN TEST DEVICE W/FF 24-SOIC TPC Global Service Co.Ltd.
| ||||
SN74BCT8374ADWG4 | Integrated Circuits (ICs) | Logic - Specialty Logic | Active | IC SCAN TEST DEVICE 24SOIC |
SN74BCT8374ADWR | Integrated Circuits (ICs) | Logic - Specialty Logic | Obsolete item | IC SCAN TEST DEVICE W/FF 24-SOIC |
SN74BCT8374ADWR TI 10000 2013+ SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS World Link Parts components Dev.ltd-ORIGINAL ONLY
SN74BCT8374ADWRE4 Texas Instruments(TI) 30,000 2014+ IC SCAN TEST DEVICE W/FF 24-SOIC enkaite Electronics Co., Ltd
| ||||
SN74BCT8374ADWRE4 | Integrated Circuits (ICs) | Logic - Specialty Logic | Obsolete item | IC SCAN TEST DEVICE W/FF 24-SOIC |
SN74BCT8374ADWRE4 Texas Instruments(TI) 30,000 2014+ IC SCAN TEST DEVICE W/FF 24-SOIC enkaite Electronics Co., Ltd
| ||||
SN74BCT8374ADWRG4 | Integrated Circuits (ICs) | Logic - Specialty Logic | Obsolete item | IC SCAN TEST DEVICE 24SOIC |